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Achievement
and Works in Progress
GTLeader
is developing.
• Transient
latch-up testing (TLU)
• Accurate system level ESD testing and protection
Selective
publications by GTLeader staff on ESD.
• Jaesik
Lee, Ki-Wook Kim, Yoon Huh, Peter Bendix, and Sung-Mo Kang, “Chip-Level
Charged-Device Modeling and Simulation in CMOS Integrated
Circuits,” IEEE Transactions
on Computer-Aided Design of Integrated Circuits and Systems,
pp. 67 – pp. 81,
vol. 22, Jan. 2003
• V. Axelrad, Yoon Huh, Jau-Wen Chen, and Peter Bendix, “A
Novel CDM-like Discharge
Effect during Human Body Model (HBM) ESD Stress,” IEICE
Trans. Electronics, accepted
for publication
• Leo G. Henry, “All ESD Standards Are Not Created Equal-
An RS Analysis,”
CE-Magazine, Jul/Aug, 2003
• Leo G. Henry, “All ESD Testing Types Are Not created
Equal- Part I,”
CE- Magazine, March/April, 2003
• Leo G. Henry, et al, “Real HBM and MM events- The dV/dT
Threat,”
EOS/ESD Symposium, 2003, pp. 179
• Leo G. Henry, et al, “Standardization of the TLP Methodology
for ESD,”
EOS/ESD Symposium, 2003, pp. 372
• Yoon Huh, V. Axelrad, Jau-Wen Chen, and Peter Bendix, “The
Effects of Substrate
Coupling on Triggering Uniformity and ESD Failure Threshold
of Fully Silicided NMOS
Transistors,” IEEE 2002 Symposium on VLSI Technology,
pp. 220-221, 2002
• Jaesik Lee, Yoon Huh, Peter Bendix, and Sung-Mo Kang, “Noise-Aware
Design for ESD
Reliability in Mixed-Signal Integrated Circuits,” IEEE
ASIC/SOC Conference,
pp. 437-441, 2001
• Q. Li, Yoon Huh, Jau-Wen Chen, Peter Bendix, and Sung-Mo
Kang, “Full Chip ESD Design
Rule Checking,” IEEE International Symposium on Circuits
and Systems (ISCAS),
pp. V-503-506, 2001
• Jaesik Lee, Yoon Huh, Jau-Wen Chen, Peter Bendix, and Sung-Mo
Kang, “Chip-Level
Simulation for CDM Failures in Multi-Power ICs,” IEEE
EOS/ESD Symp.,
pp. 456-464, 2000
• Leo G. Henry et al, “TLP Calibration, Correlation, Standards,
and New Techniques,”
ESO/ESD Symposium, 2000, pp. 85
• Leo G. Henry et al, “Developing a Transient Induced
Latch-up (TLU)-Standard for Testing
Integrated Circuits,” EOS/ESD Symposium, 1999, pp.178
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